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Book Sections Year : 2022

Test and Reliability of Approximate Hardware


The undeniable need of energy efficiency in today’s devices is leading to the adoption of innovative computing paradigms—such as Approximate Computing. As this paradigm is gaining increasing interest, important challenges, as well as opportunities, arise concerning the dependability of those systems. This chapter will focus on test and reliability issues related to approximate hardware systems. It will cover problems and solutions concerning the impact of the approximation on hardware defect classification, test generation, and test application. Moreover, the impact of the approximation on the fault tolerance will be discussed, along with related design solutions to mitigate it.
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hal-03888016 , version 1 (13-02-2023)



Marcello Traiola, Bastien Deveautour, Alberto Bosio, Patrick Girard, Arnaud Virazel. Test and Reliability of Approximate Hardware. Approximate Computing, Springer International Publishing, pp.233-266, 2022, ⟨10.1007/978-3-030-98347-5_10⟩. ⟨hal-03888016⟩
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