Test and Reliability of Approximate Hardware
Abstract
The undeniable need of energy efficiency in today’s devices is leading to the adoption of innovative computing paradigms—such as Approximate Computing. As this paradigm is gaining increasing interest, important challenges, as well as opportunities, arise concerning the dependability of those systems. This chapter will focus on test and reliability issues related to approximate hardware systems. It will cover problems and solutions concerning the impact of the approximation on hardware defect classification, test generation, and test application. Moreover, the impact of the approximation on the fault tolerance will be discussed, along with related design solutions to mitigate it.
Keywords
Approximate computing
Test
Reliability
Approximate circuits
Fault classification
Test pattern generation
Approximation-aware test application methodology
Fault injection
Error analysis
Error detection and correction
Fault masking
Triple modular redundancy
Duplication with comparison
Approximate fault tolerance
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