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Conference Papers Year : 2019

Multiple Mutation Testing for Timed Finite State Machine with Timed Guards and Timeouts

Abstract

The problem of generating tests detecting all logical and timing faults which can occur in real-time systems is challenging; this is because the number of (timing) faults is potentially too big or infinite. As a result, it might be time consuming to generate an important number of adequate tests. The traditional model based testing approach considers a fault domain as the universe of all machines with a given number of states and input-output alphabet while mutation based approaches define a list of mutants to kill with a test suite. In this paper, we combine the two approaches by developing a mutation testing technique for real-time systems represented with deterministic timed finite state machines with timed guards and timeouts (TFSM-TG). In this approach, fault domains consisting of fault-seeded versions of the specification (mutants) are represented with non-deterministic TFSM-TG. The test generation avoids the one-by-one enumeration of the mutants and is based on constraint solving. We present the results of an empirical proof-of-concept implementation of the proposed approach.
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hal-02341856 , version 1 (31-10-2019)

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  • HAL Id : hal-02341856 , version 1

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Omer Nguena Timo, Dimitri Prestat, Antoine Rollet. Multiple Mutation Testing for Timed Finite State Machine with Timed Guards and Timeouts. 31th IFIP International Conference on Testing Software and Systems (ICTSS), Oct 2019, Paris, France. ⟨hal-02341856⟩
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