Off-line Test Selection with Test Purposes for Non-Deterministic Timed Automata. - Inria - Institut national de recherche en sciences et technologies du numérique Access content directly
Conference Papers Year : 2011
No file

Dates and versions

inria-00629177 , version 1 (05-10-2011)

Identifiers

  • HAL Id : inria-00629177 , version 1

Cite

Nathalie Bertrand, Thierry Jéron, Amélie Stainer, Moez Krichen. Off-line Test Selection with Test Purposes for Non-Deterministic Timed Automata.. 17th International Conference on Tools and Algorithms for the Construction and Analysis of Systems (TACAS'11), Mar 2011, Saarbrücken, Germany. pp. 96-111. ⟨inria-00629177⟩
55 View
0 Download

Share

Gmail Facebook X LinkedIn More