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Conference Papers Year : 2007

Intersection Testing between an Ellipsoid and an Algebraic Surface

Abstract

This paper presents a new method on the intersection testing problem between an ellipsoid and an algebraic surface. In the new method, the testing problem is turned into a new testing problem whether a univariate polynomial has a positive or negative real root. Examples are shown to illustrate the robustness and efficiency of the new method.
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Dates and versions

inria-00518388 , version 1 (17-09-2010)

Identifiers

  • HAL Id : inria-00518388 , version 1

Cite

Xiao-Diao Chen, Jun-Hai Yong, Jean-Claude Paul, Jiaguang Sun. Intersection Testing between an Ellipsoid and an Algebraic Surface. Proceedings of the Tenth International Conference on Computer Aided Design and Computer Graphics (CAD-CG'07), School of Electronics Engineering and Computer Science, Peking University, Oct 2007, Beijing, China. ⟨inria-00518388⟩

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