Rare event analysis in technological catastrophes - Inria - Institut national de recherche en sciences et technologies du numérique
Conference Papers Year : 2019

Rare event analysis in technological catastrophes

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Dates and versions

hal-02430575 , version 1 (08-01-2020)

Identifiers

  • HAL Id : hal-02430575 , version 1

Cite

Gerardo Rubino. Rare event analysis in technological catastrophes. ICT-DM 2019 - 6th International Conference on Information and Communication Technologies for Disaster Management, Dec 2019, Paris, France. ⟨hal-02430575⟩
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