Study of measurements bias due to environmental and spatial discretization in long term thermal monitoring of structures by infrared thermography - Inria - Institut national de recherche en sciences et technologies du numérique Access content directly
Conference Papers Year : 2018

Study of measurements bias due to environmental and spatial discretization in long term thermal monitoring of structures by infrared thermography

Abstract

The purpose of this study is to characterize the influence of environmental parameters for long-term in-situ structure monitoring as well as projections errors due to camera view and digitization. Measurements made on an instrumented test site have been made during the last 3 years, bringing an interesting dataset to exploit. The model used to convert the gathered data to temperature is firstly presented and discussed. Then, the effect of camera resectioning on infrared measurements is commented. Finally, the effect of the environmental parameters is studied and perspectives are proposed.
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Dates and versions

hal-01890292 , version 1 (08-10-2018)

Identifiers

  • HAL Id : hal-01890292 , version 1

Cite

Thibaud Toullier, Jean Dumoulin, Laurent Mevel. Study of measurements bias due to environmental and spatial discretization in long term thermal monitoring of structures by infrared thermography. QIRT 2018 - 14th Quantitative InfraRed Thermography Conference, Jun 2018, Berlin, Germany. ⟨hal-01890292⟩
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