A scale-adaptive method for retracing and registering in correlative light-electron microscopy. - Inria - Institut national de recherche en sciences et technologies du numérique Access content directly
Conference Papers Year : 2016

A scale-adaptive method for retracing and registering in correlative light-electron microscopy.

Abstract

Correlative light-electron microscopy (CLEM) aims at a better understanding of cell mechanisms by relating dynamics with structure. However, LM and EM images are of very different size, resolution, field-of-view, appearance, usually requiring manual assistance at one or several stages. We have defined an original automated CLEM retracing-and-registration method involving a common representation with adaptive scale for both types of images, and the specification of appropriate descriptors and similarity criterion for the EM patch search.
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Dates and versions

hal-01416850 , version 1 (14-12-2016)

Identifiers

  • HAL Id : hal-01416850 , version 1

Cite

Bertha Mayela Toledo Acosta, Patrick Bouthemy, Charles Kervrann. A scale-adaptive method for retracing and registering in correlative light-electron microscopy.. SIAM Imaging Science, SIAM, May 2016, Albuquerque, United States. ⟨hal-01416850⟩

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