Modeling Local and Global Deformations in Deep Learning: Epitomic Convolution, Multiple Instance Learning, and Sliding Window Detection - Inria - Institut national de recherche en sciences et technologies du numérique Access content directly
Conference Papers Year : 2015
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hal-01263611 , version 1 (27-01-2016)

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  • HAL Id : hal-01263611 , version 1

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George Papandreou, Iasonas Kokkinos, Pierre-André Savalle. Modeling Local and Global Deformations in Deep Learning: Epitomic Convolution, Multiple Instance Learning, and Sliding Window Detection . IEEE Conference on Computer Vision and Pattern Recognition, Jun 2015, Boston, United States. ⟨hal-01263611⟩
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