Visual quality inspection and fine anomalies: methods and application

This study develops a surface inspection methodology used to detect complex geometry products and metallic reflective surfaces imperfections. This work is based on combination of three complementary methods: an optical one (structured light information), an algorithmic one (data processing) and a statistical one (parameters processing). A usual industrial application illustrates this processing.

Mots clés

Computer Vision Image Processing Statistic Quality Inspection Surface metrology

Domaines

Informatique [cs]

Fichier principal

978-3-662-45586-9_13_Chapter.pdf (418.92 Ko)

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https://inria.hal.science/hal-01260893

Soumis le : vendredi 22 janvier 2016-16:35:37

Dernière modification le : mercredi 18 décembre 2024-10:16:02

Archivage à long terme le : samedi 23 avril 2016-10:57:43

Dates et versions

hal-01260893 , version 1 (22-01-2016)

Licence

Paternité

Identifiants

HAL Id : hal-01260893 , version 1
DOI : 10.1007/978-3-662-45586-9_13

Citer

Simon-Frédéric Desage, Gilles Pitard, Maurice Pillet, Hugues Favrelière, Fabrice Frelin, et al.. Visual quality inspection and fine anomalies: methods and application. Svetan Ratchev. Precision Assembly Technologies and Systems : 7th IFIP WG 5.5 International Precision Assembly Seminar, IPAS 2014, Chamonix, France, February 16-18, 2014, Revised Selected Papers, AICT-435, Springer, pp.94-106, 2014, IFIP Advances in Information and Communication Technology, 978-3-662-45585-2. ⟨10.1007/978-3-662-45586-9_13⟩. ⟨hal-01260893⟩

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