Identifying defects in an unknown background using differential measurements - Inria - Institut national de recherche en sciences et technologies du numérique
Journal Articles Inverse Problems and Imaging Year : 2015

Identifying defects in an unknown background using differential measurements

Abstract

We present a new qualitative imaging method capable of selecting defects in complex and unknown background from differential measurements of farfield operators: i.e. far measurements of scattered waves in the cases with and without defects. Indeed, the main difficulty is that the background physical properties are unknown. Our approach is based on a new exact characterization of a scatterer domain in terms of the far field operator range and the link with solutions to so-called interior transmission problems. We present the theoretical foundations of the method and some validating numerical experiments in a two dimensional setting.

Dates and versions

hal-01110270 , version 1 (27-01-2015)

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Cite

Lorenzo Audibert, Girard Alexandre, Houssem Haddar. Identifying defects in an unknown background using differential measurements. Inverse Problems and Imaging , 2015, 9 (3), ⟨10.3934/ipi.2015.9.625⟩. ⟨hal-01110270⟩
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