Derivation of Accurate Tensor Data of Materials in SAW Devices by Solving a Parameter Identification Problem Using an Enhanced Eigenvalue Analysis of an Infinite Array Model - Inria - Institut national de recherche en sciences et technologies du numérique Access content directly
Conference Papers Year : 2013

Derivation of Accurate Tensor Data of Materials in SAW Devices by Solving a Parameter Identification Problem Using an Enhanced Eigenvalue Analysis of an Infinite Array Model

Markus Mayer
  • Function : Author
Matthias Knapp
  • Function : Author
Philipp Jaeger
  • Function : Author
Thomas Ebner
  • Function : Author
Karl Wagner
  • Function : Author
Hans-Josef Pesch
  • Function : Author
  • PersonId : 898506

Abstract

Accurate simulations of SAW elements require accurate material parameters. However, literature values, usually based on measurements of thick crystals, mostly don’t reflect the properties of thin film layers used within SAW devices with the necessary precision. In this work, a parameter identification procedure is presented, which can determine these material parameters based on measurements of admittance curves of SAW resonators and wave velocities within SAW delay lines. The optimization problem is solved using a surrogate model, where the surrogate models are built up efficiently and reliably using a predictor / corrector technique utilizing several iterative FEM techniques.
No file

Dates and versions

hal-01101265 , version 1 (08-01-2015)

Identifiers

Cite

Gerold Grünauer, Markus Mayer, Matthias Knapp, Philipp Jaeger, Thomas Ebner, et al.. Derivation of Accurate Tensor Data of Materials in SAW Devices by Solving a Parameter Identification Problem Using an Enhanced Eigenvalue Analysis of an Infinite Array Model. 2013 IEEE International Ultrasonics Symposium (IUS), 2013, Prague, Czech Republic. pp.1700-1703, ⟨10.1109/ULTSYM.2013.0433⟩. ⟨hal-01101265⟩
188 View
0 Download

Altmetric

Share

Gmail Facebook X LinkedIn More