Collaborative Distributed Computing in the Field of Digital Electronics Testing - Inria - Institut national de recherche en sciences et technologies du numérique
Communication Dans Un Congrès Année : 2010

Collaborative Distributed Computing in the Field of Digital Electronics Testing

Résumé

Computation tasks used in digital design flow for test quality evaluation can require a lot of processor and memory resources. To speed up execution and to overcome memory restrictions, a collaborative computing approach was proposed in this paper. Web-based system architecture allows seamlessly aggregate many remote computers for one application. Efficient collaboration requires credit based priority concept, issues of task partitioning, task allocation, load balancing and model security must be handled. Experimental results show feasibility of proposed solution and gain in performance.
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hal-01060718 , version 1 (16-11-2017)

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Eero Ivask, Sergei Devadze, Raimund Ubar. Collaborative Distributed Computing in the Field of Digital Electronics Testing. 9th IFIP WG 5.5 International Conference on Balanced Automation Systems for Future Manufacturing Networks (BASYS), Jul 2010, Valencia, Spain. pp.145-152, ⟨10.1007/978-3-642-14341-0_17⟩. ⟨hal-01060718⟩
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