Focused Ion Beam Micro Machining and Micro Assembly
Abstract
The ability to manufacture and manipulate components
at the micro-scale is critical to the development of micro systems. This
paper presents the technique to manipulate micro/nano parts at the
micro/nano-scale using an integrated Focused Ion Beam (FIB) system
composed of scanning electron microscope, micro manipulator and gas
injection system. Currently the smallest gears manufactured with
traditional techniques were reported to have a module of 10 μm. As a
test example, in this research we applied the above integrated FIB
technique and had successfully fabricated micro gears with module of
0.3μm, with the precision improved for more than thirty times compared
to the traditionally manufactured gears. Currently the integrated FIB
technique is extended to cover the micro-assembly of devices in our
centre, besides the micro-manufacture procedure.
Domains
Digital Libraries [cs.DL]Origin | Files produced by the author(s) |
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