High-Q Slow-Wave Coplanar Transmission Lines on 0.35 μm Process - Inria - Institut national de recherche en sciences et technologies du numérique
Article Dans Une Revue IEEE Microwave and Wireless Components Letters Année : 2009

High-Q Slow-Wave Coplanar Transmission Lines on 0.35 μm Process

Résumé

In this letter, experimental results and trends for shielded coplanar waveguide transmission lines (S-CPW) implemented in a 0.35 μm CMOS technology are provided. Because of the introduction of floating strips below the CPW transmission line, high effective dielectric permittivity and quality factor are obtained. Three different geometries of S-CPW transmission lines are characterized. For the best geometry, the measured effective dielectric permittivity reaches 48, leading to a very high slow-wave factor and high miniaturization. In addition, measurements demonstrate a quality factor ranging from 20 to 40 between 10 and 40 GHz, demonstrating state-of-the-art results for transmission lines realized in a low-cost CMOS standard technology.
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Dates et versions

hal-01023128 , version 1 (11-07-2014)

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Citer

D. Kaddour, H. Issa, Anne-Laure Franc, Nicolas Corrao, Emmanuel Pistono, et al.. High-Q Slow-Wave Coplanar Transmission Lines on 0.35 μm Process. IEEE Microwave and Wireless Components Letters, 2009, 19 (9), pp.542-544. ⟨10.1109/lmwc.2009.2027053⟩. ⟨hal-01023128⟩
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