Pairwise Testing for Software Product Lines: Comparison of Two Approaches - Inria - Institut national de recherche en sciences et technologies du numérique Access content directly
Journal Articles Software Quality Journal Year : 2012

Pairwise Testing for Software Product Lines: Comparison of Two Approaches

Abstract

Software Product Lines (SPL) are difficult to validate due to combinatorics induced by variability, which in turn leads to combinatorial explosion of the number of derivable products. Exhaustive testing in such a large products space is hardly feasible. Hence, one possible option is to test SPLs by generating test configurations that cover all possible t feature interactions (t-wise). It dramatically reduces the number of test products while ensuring reasonable SPL coverage. In this paper, we report our experience on applying t-wise techniques for SPL with two independent toolsets developed by the authors. One focuses on generality and splits the generation problem according to strategies. The other emphasizes providing efficient generation. To evaluate the respective merits of the approaches, measures such as the number of generated test configurations and the similarity between them are provided. By applying these measures we were able to derive useful insights for pairwise and t-wise testing of product lines.
Fichier principal
Vignette du fichier
ICST-SPLC-SQJ2010-Ext.pdf (659.55 Ko) Télécharger le fichier
Origin : Files produced by the author(s)

Dates and versions

hal-00805856 , version 1 (29-03-2013)

Identifiers

Cite

Gilles Perrouin, Sabastian Oster, Sagar Sen, Jacques Klein, Benoit Baudry, et al.. Pairwise Testing for Software Product Lines: Comparison of Two Approaches. Software Quality Journal, 2012, 20 (3-4), pp.605-643. ⟨10.1007/s11219-011-9160-9⟩. ⟨hal-00805856⟩
306 View
914 Download

Altmetric

Share

Gmail Facebook X LinkedIn More