PACOGEN : Automatic Generation of Pairwise Test Configurations from Feature Models - Inria - Institut national de recherche en sciences et technologies du numérique
Communication Dans Un Congrès Année : 2011

PACOGEN : Automatic Generation of Pairwise Test Configurations from Feature Models

Résumé

Feature models are commonly used to specify variability in software product lines. Several tools support feature models for variability management at different steps in the development process. However, tool support for test configuration generation is currently limited. This test generation task consists in systematically selecting a set of configurations that represent a relevant sample of the variability space and that can be used to test the product line. In this paper we propose PACOGEN to analyze feature models and automatically generate a set of configurations that cover all pairwise interactions between features. PACOGEN relies on constraint programming to generate configurations that satisfy all constraints imposed by the feature model and to minimize the set of the tests configurations. This work also proposes an extensive experiment, based on the state-of-the art SPLOT feature models repository, showing that PACOGEN scales over variability spaces with millions of configurations and covers pairwise with less configurations than other available tools.
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Dates et versions

hal-00699558 , version 1 (21-05-2012)

Identifiants

  • HAL Id : hal-00699558 , version 1

Citer

Aymeric Hervieu, Benoit Baudry, Arnaud Gotlieb. PACOGEN : Automatic Generation of Pairwise Test Configurations from Feature Models. Proc. of Int. Symp. on Soft. Reliability Engineering (ISSRE'11), Nov 2011, Hiroshima, Japan. ⟨hal-00699558⟩
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