Guest Editorial for Special Section on Mutation Testing. - Inria - Institut national de recherche en sciences et technologies du numérique Access content directly
Journal Articles Information and Software Technology Year : 2011
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hal-00641272 , version 1 (15-11-2011)

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  • HAL Id : hal-00641272 , version 1

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Benoit Baudry, Gordon Fraser, Jeremy Bradbury. Guest Editorial for Special Section on Mutation Testing.. Information and Software Technology, 2011. ⟨hal-00641272⟩
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