Statistical Subspace based model free damage localization - Inria - Institut national de recherche en sciences et technologies du numérique Access content directly
Conference Papers Year : 2011
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inria-00627623 , version 1 (29-09-2011)

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  • HAL Id : inria-00627623 , version 1

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Michael Döhler, Laurent Mevel, Dionisio Bernal. Statistical Subspace based model free damage localization. Engineering Mechanics Institut Conference, Jun 2011, Boston, United States. ⟨inria-00627623⟩
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