Journal Articles
Journal of Experimental and Theoretical Artificial Intelligence
Year : 2018
Jean-Louis Lanet : Connect in order to contact the contributor
https://inria.hal.science/hal-01645392
Submitted on : Thursday, November 23, 2017-8:05:39 AM
Last modification on : Wednesday, October 25, 2023-3:32:03 PM
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- HAL Id : hal-01645392 , version 1
- DOI : 10.1080/0952813x.2017.1409276
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Yayaoui Cheherazed, Jean-Louis Lanet, Mohamed Mezghiche, Karim Tamine. Machine Learning Techniques to Predict Sensitive Patterns to Fault Attack in the Java Card Application. Journal of Experimental and Theoretical Artificial Intelligence, 2018, 30 (1), pp.101-127. ⟨10.1080/0952813x.2017.1409276⟩. ⟨hal-01645392⟩
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