Machine Learning Techniques to Predict Sensitive Patterns to Fault Attack in the Java Card Application - Inria - Institut national de recherche en sciences et technologies du numérique Access content directly
Journal Articles Journal of Experimental and Theoretical Artificial Intelligence Year : 2018
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hal-01645392 , version 1 (23-11-2017)

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Yayaoui Cheherazed, Jean-Louis Lanet, Mohamed Mezghiche, Karim Tamine. Machine Learning Techniques to Predict Sensitive Patterns to Fault Attack in the Java Card Application. Journal of Experimental and Theoretical Artificial Intelligence, 2018, 30 (1), pp.101-127. ⟨10.1080/0952813x.2017.1409276⟩. ⟨hal-01645392⟩
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