ATLTest: A White-Box Test Generation Approach for ATL Transformations - Inria - Institut national de recherche en sciences et technologies du numérique
Conference Papers Year : 2012

ATLTest: A White-Box Test Generation Approach for ATL Transformations

Abstract

MDE is being applied to the development of increasingly complex systems that require larger model transformations. Given that the specification of such transformations is an error-prone task, techniques to guarantee their quality must be provided. Testing is a well-known technique for finding errors in programs. In this sense, adoption of testing techniques in the model transformation domain would be helpful to improve their quality. So far, testing of model transformations has focused on black-box testing techniques. Instead, in this paper we provide a white-box test model generation approach for ATL model transformations.
Fichier principal
Vignette du fichier
atltest.pdf (522.22 Ko) Télécharger le fichier
Origin Files produced by the author(s)
Loading...

Dates and versions

hal-00711819 , version 1 (29-06-2012)

Identifiers

  • HAL Id : hal-00711819 , version 1

Cite

Carlos Alberto González Pérez, Jordi Cabot. ATLTest: A White-Box Test Generation Approach for ATL Transformations. ACM/IEEE 15th International Conference on Model Driven Engineering Languages & Systems MODELS 2012, Sep 2012, Innsbruck, Austria. ⟨hal-00711819⟩
626 View
3331 Download

Share

More