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Journal Articles Information Processing Letters Year : 2004

The worst-case chip problem


In the system level, adaptive fault diagnosis problem we must determine which components (chips) in a system are defective, assuming the majority of them are good. Chips are tested as follows: Take two chips, say x and y, and have x report whether y is good or bad. If x is good, the answer is correct, but if x is bad, the answer is unreliable. One way to identify all defective chips is to identify a single good chip which can then be used to diagnose the other chips; the chip problem is to identify a single good chip. We show that the chip problem is closely related to a modified majority problem in the worst case and use this fact to obtain upper and lower bounds on algorithms for the chip problem.
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Dates and versions

inria-00100040 , version 1 (26-09-2006)


  • HAL Id : inria-00100040 , version 1


Laurent Alonso, Philippe Chassaing, Edward M. Reingold, René Schott. The worst-case chip problem. Information Processing Letters, 2004, 89 (6), pp.303-308. ⟨inria-00100040⟩
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