Imaging junctions of waveguides - Inria - Institut national de recherche en sciences et technologies du numérique Accéder directement au contenu
Article Dans Une Revue Inverse Problems and Imaging Année : 2021

Imaging junctions of waveguides

Résumé

In this paper we address the identification of defects by the Linear Sampling Method in half-waveguides which are related to each other by junctions. Firstly a waveguide which is characterized by an abrupt change of properties is considered, secondly the more difficult case of several half-waveguides related to each other by a junction of complex geometry. Our approach is illustrated by some two-dimensional numerical experiments.
Fichier principal
Vignette du fichier
article_junction_hal.pdf (6.54 Mo) Télécharger le fichier
Origine : Fichiers produits par l'(les) auteur(s)
Loading...

Dates et versions

hal-02567182 , version 1 (11-05-2020)

Identifiants

Citer

Laurent Bourgeois, Jean-François Fritsch, Arnaud Recoquillay. Imaging junctions of waveguides. Inverse Problems and Imaging , 2021, ⟨10.3934/ipi.2020065⟩. ⟨hal-02567182⟩
152 Consultations
118 Téléchargements

Altmetric

Partager

Gmail Facebook X LinkedIn More