Improved Fault Analysis of Signature Schemes - Inria - Institut national de recherche en sciences et technologies du numérique
Communication Dans Un Congrès Année : 2010

Improved Fault Analysis of Signature Schemes

Christophe Giraud
Erik W. Knudsen
  • Fonction : Auteur

Résumé

At ACISP 2004, Giraud and Knudsen presented the first fault analysis of DSA, ECDSA, XTR-DSA, Schnorr and ElGamal signatures schemes that considered faults affecting one byte. They showed that 2304 faulty signatures would be expected to reduce the number of possible keys to 240, allowing a 160-bit private key to be recovered. In this paper we show that Giraud and Knudsen's fault attack is much more efficient than originally claimed. We prove that 34.3% less faulty signatures are required to recover a private key using the same fault model. We also show that their original way of expressing the fault model under a system of equations can be improved. A more precise expression allows us to obtain another improvement of up to 47.1%, depending on the values of the key byte affected.
Fichier principal
Vignette du fichier
FAonSS.pdf (217.24 Ko) Télécharger le fichier
Origine Fichiers produits par l'(les) auteur(s)
Loading...

Dates et versions

hal-01056107 , version 1 (14-08-2014)

Licence

Identifiants

Citer

Christophe Giraud, Erik W. Knudsen, Michael Tunstall. Improved Fault Analysis of Signature Schemes. 9th IFIP WG 8.8/11.2 International Conference on Smart Card Research and Advanced Applications (CARDIS), Apr 2010, Passau, Germany. pp.164-181, ⟨10.1007/978-3-642-12510-2_12⟩. ⟨hal-01056107⟩
57 Consultations
110 Téléchargements

Altmetric

Partager

More