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Bienvenue sur la collection HAL du LARIS
Direction | Sébastien LAHAYE
Référent·e HAL | Marie-Françoise GÉRARD
Fichiers
468
Références
824
Proportion d'Open Access
45 %
Actualités du Laboratoire
Mots-Clés
Algorithm
Cycle time
Monitoring
Electroencephalography
Quantum information
Fiabilité
Bayesian inference
MATLAB
Max-plus algebra
Deep learning
Imaging
Stroke
Timed event graphs
Image analysis
Fault diagnosis
Data augmentation
Conducted immunity
Lean manufacturing
Microcirculation
Fault detection
Prediction
Petri nets
Classification
Graph matching
Accelerated testing
Cerebral palsy
Correlation
Machine Learning
Performance
Accelerated degradation test
Data mining
Diagnosis
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Numerical simulation
Heat recovery
Estimation
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Heat transfer
Epilepsy
Nonlinear dynamics
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Complexity
Modeling
Empirical mode decomposition
Image processing
Entropy
Conjugate gradient method
Stochastic resonance
Texture
Complex systems
Computer vision
Awake surgery
Degradation
Control chart
Bayesian networks
Réalité virtuelle
Cognition
Virtual reality
MRI
Irregularity
Durability
Control
Accelerated tests
Degradation process
Multiscale entropy
Discrete event systems
Partial differential equations
Aging
Quantum noise
Quadratic assignment problem
Interval analysis
Inverse problem
Interaction Techniques
Optimization
Social cognition
Thermal comfort
Brain
Convolutional neural network
Older adults
COVID-19
Optimisation
Max
Machine learning
Sample entropy
State estimation
Parameter estimation
Six Sigma
Laser speckle contrast imaging
Inverse problems
Segmentation
Diagnostic
Gamma process
Bayesian network
Feature extraction
Concrete
Simulation
Decoherence
Thermal modeling
Complexité
Publications des équipes de recherche du LARIS
SDO | Systèmes Dynamiques et Optimisation ISISV | Information, Signal, Image et Sciences du Vivant SFD | Sûreté de Fonctionnement et aide à la DécisionDernières parutions
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Jaber Al Rashid, Mohsen Koohestani, Laurent Saintis, Mihaela Barreau. Degradation and Reliability Modeling of EM Robustness of Voltage Regulators Based on ADT: An Approach and A Case Study. IEEE Transactions on Device and Materials Reliability, 2024, 24 (1), pp.2-13. ⟨10.1109/TDMR.2023.3340426⟩. ⟨hal-04334074⟩