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Article Dans Une Revue Microelectronics Reliability Année : 2004

Reliability determination of aluminium electrolytic capacitors by the mean of various methods. Application to the protection system of the LHC

Résumé

The lifetime of power electronic components is often calculated from reliability reports, but this method can be discussed. We compare in this article the results of various reliability reports to an accelerated ageing test of component and introduced the load-strength concept. Large aluminium electrolytic capacitors are taken here in example in the context of the protection system of LHC (Large Hadron Collider) in CERN where the level of reliability is essential. We notice important differences of MTBF (Mean Time Between Failure) according to the reliability report used. Accelerating ageing tests carried out prove that a Weibull law is more adapted to determinate failure rates of components. The load-strength concept associated with accelerated ageing tests can be a solution to determine the lifetime of power electronic components.
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Dates et versions

hal-00140548 , version 1 (21-02-2008)

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Frédéric Perisse, Pascal Venet, Gérard Rojat. Reliability determination of aluminium electrolytic capacitors by the mean of various methods. Application to the protection system of the LHC. Microelectronics Reliability, 2004, 44 (9-11), pp.1757-1762. ⟨10.1016/j.microre1.2004.07.108⟩. ⟨hal-00140548⟩
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