Mapping the Energy Landscape from a Nanocrystal-Based Field Effect Transistor under Operation using Nanobeam Photoemission Spectroscopy - Inria - Institut national de recherche en sciences et technologies du numérique Access content directly
Journal Articles Nano Letters Year : 2023

Mapping the Energy Landscape from a Nanocrystal-Based Field Effect Transistor under Operation using Nanobeam Photoemission Spectroscopy

Huichen Zhang
Claire Abadie
Dario Mastrippolito
Yoann Prado
Mathieu Silly
  • Function : Author
José Avila
  • Function : Author

Abstract

As the field of nanocrystal-based optoelectronics matures, more advanced techniques must be developed in order to reveal the electronic structure of nanocrystals, particularly with devicerelevant conditions. So far, most of the efforts have been focused on optical spectroscopy, and electrochemistry where an absolute energy reference is required. Device optimization requires probing not only the pristine material but also the material in its actual environment (i.e., surrounded by a transport layer and an electrode, in the presence of an applied electric field). Here, we explored the use of photoemission microscopy as a strategy for operando investigation of NC-based devices. We demonstrate that the method can be applied to a variety of materials and device geometries. Finally, we show that it provides a direct access to the metal-semiconductor interface band bending as well as the distance over which the gate effect propagates in field-effect transistors.
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Dates and versions

hal-03954965 , version 1 (24-01-2023)

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Mariarosa Cavallo, Erwan Bossavit, Huichen Zhang, Corentin Dabard, Tung Huu Dang, et al.. Mapping the Energy Landscape from a Nanocrystal-Based Field Effect Transistor under Operation using Nanobeam Photoemission Spectroscopy. Nano Letters, 2023, 23 (4), pp.1363-1370. ⟨10.1021/acs.nanolett.2c04637⟩. ⟨hal-03954965⟩
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