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Article Dans Une Revue Thin Solid Films Année : 2022

Interface analysis of Mg/Sc and Sc/Mg bilayers using X-ray reflectivity

Résumé

Mg/Sc and Sc/Mg bilayers were studied to investigate their interfaces. Time-of-flight secondary ion mass spectroscopy and grazing incidence x-ray reflectivity are combined to determine the realistic structure of the bilayer stack: thickness, refractive index, and roughness of layers and interlayers respectively. In addition, soft x-ray reflectivity measurements provide sensitive information about the chemical environment of scandium, when the incident photon energy is tuned in the vicinity of the Sc L-absorption edge (~ 400 eV). Both Mg-on-Sc and Scon-Mg interfaces have high roughness (~1 nm) and a MgSc compound interlayer but are shown to be asymmetric.
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Dates et versions

hal-03890526 , version 1 (08-12-2022)

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Hina Verma, Karine Le Guen, Shruti Gupta, Rajnish Dhawan, Mohammed H Modi, et al.. Interface analysis of Mg/Sc and Sc/Mg bilayers using X-ray reflectivity. Thin Solid Films, 2022, 763, pp.139595. ⟨10.1016/j.tsf.2022.139595⟩. ⟨hal-03890526⟩
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