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Article Dans Une Revue ACS Applied Materials & Interfaces Année : 2022

High-Sensitivity Microthermometry Method Based on Vacuum-Deposited Thin Films Exhibiting Gradual Spin Crossover above Room Temperature

Résumé

We report on the fabrication, characterization, and microthermometry application of high-quality, nanometric thin films, with thicknesses in the range 20–200 nm, of the molecular spin-crossover complex [Fe(HB(1,2,3-triazol-1-yl)3)2]. The films were obtained by vacuum thermal evaporation and characterized by X-ray diffraction, UV spectrophotometry, and atomic force microscopy. The as-deposited films are dense and crystalline with a preferred [011] orientation of the monoclinic crystal lattice normal to the substrate surface. The films exhibit a gradual spin conversion centered at ca. 374 K spanning the 273–473 K temperature range, irrespective of their thickness. When deposited on a microelectronic device, these films can be used to enhance the UV-light thermoreflectance coefficient of reflective surfaces by more than an order of magnitude, allowing for high-sensitivity thermoreflectance thermal imaging.
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Dates et versions

hal-03853995 , version 1 (15-11-2022)

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Oleksandr Ye. Horniichuk, Karl Ridier, Lijun Zhang, Yuteng Zhang, Gábor Molnár, et al.. High-Sensitivity Microthermometry Method Based on Vacuum-Deposited Thin Films Exhibiting Gradual Spin Crossover above Room Temperature. ACS Applied Materials & Interfaces, 2022, 14 (46), pp.52140-52148. ⟨10.1021/acsami.2c13834⟩. ⟨hal-03853995⟩
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