<?xml version="1.0" encoding="utf-8"?>
<TEI xmlns="http://www.tei-c.org/ns/1.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:hal="http://hal.archives-ouvertes.fr/" xmlns:gml="http://www.opengis.net/gml/3.3/" xmlns:gmlce="http://www.opengis.net/gml/3.3/ce" version="1.1" xsi:schemaLocation="http://www.tei-c.org/ns/1.0 http://api.archives-ouvertes.fr/documents/aofr-sword.xsd">
  <teiHeader>
    <fileDesc>
      <titleStmt>
        <title>HAL TEI export of hal-02903003</title>
      </titleStmt>
      <publicationStmt>
        <distributor>CCSD</distributor>
        <availability status="restricted">
          <licence target="https://creativecommons.org/publicdomain/zero/1.0/">CC0 1.0 - Universal</licence>
        </availability>
        <date when="2026-05-26T08:42:35+02:00"/>
      </publicationStmt>
      <sourceDesc>
        <p part="N">HAL API Platform</p>
      </sourceDesc>
    </fileDesc>
  </teiHeader>
  <text>
    <body>
      <listBibl>
        <biblFull>
          <titleStmt>
            <title xml:lang="en">Clustering of Redundant Parameters for Fault Isolation with Gaussian Residuals</title>
            <author role="aut">
              <persName>
                <forename type="first">Alexander</forename>
                <surname>Mendler</surname>
              </persName>
              <idno type="halauthorid">2037842-0</idno>
              <affiliation ref="#struct-366034"/>
              <affiliation ref="#struct-581040"/>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">Michael</forename>
                <surname>Döhler</surname>
              </persName>
              <email type="md5">8bead8b4c1e2b9454e86a2b4d10f8471</email>
              <email type="domain">inria.fr</email>
              <idno type="idhal" notation="string">michael-doehler</idno>
              <idno type="idhal" notation="numeric">2175</idno>
              <idno type="halauthorid" notation="string">22492-2175</idno>
              <idno type="ORCID">https://orcid.org/0000-0003-4844-5474</idno>
              <idno type="IDREF">https://www.idref.fr/159299306</idno>
              <affiliation ref="#struct-581040"/>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">Carlos</forename>
                <surname>Ventura</surname>
              </persName>
              <idno type="halauthorid">840124-0</idno>
              <affiliation ref="#struct-366034"/>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">Laurent</forename>
                <surname>Mevel</surname>
              </persName>
              <email type="md5">b5e4a468869b48aa12d342f34f0c3177</email>
              <email type="domain">inria.fr</email>
              <idno type="idhal" notation="string">laurent-mevel</idno>
              <idno type="idhal" notation="numeric">14387</idno>
              <idno type="halauthorid" notation="string">15077-14387</idno>
              <idno type="IDREF">https://www.idref.fr/093658907</idno>
              <affiliation ref="#struct-581040"/>
            </author>
            <editor role="depositor">
              <persName>
                <forename>Michael</forename>
                <surname>Döhler</surname>
              </persName>
              <email type="md5">8bead8b4c1e2b9454e86a2b4d10f8471</email>
              <email type="domain">inria.fr</email>
            </editor>
            <funder>The financial support from the Natural Sciences and Engineering Research Council of Canada (NSERC), the German Academic Exchange Service (DAAD) and the Mitacs Globalink Research Award is gratefully acknowledged.</funder>
          </titleStmt>
          <editionStmt>
            <edition n="v1" type="current">
              <date type="whenSubmitted">2020-07-20 15:26:27</date>
              <date type="whenWritten">2020-01-01</date>
              <date type="whenModified">2026-02-12 14:52:04</date>
              <date type="whenReleased">2020-07-20 15:38:37</date>
              <date type="whenProduced">2020-07-11</date>
              <date type="whenEndEmbargoed">2020-07-20</date>
              <ref type="file" target="https://inria.hal.science/hal-02903003v1/document">
                <date notBefore="2020-07-20"/>
              </ref>
              <ref type="file" subtype="author" n="1" target="https://inria.hal.science/hal-02903003v1/file/IFAC20_0831_FI.pdf" id="file-2903003-2553961">
                <date notBefore="2020-07-20"/>
              </ref>
              <ref type="externalLink" target="https://doi.org/10.1016/j.ifacol.2020.12.877"/>
            </edition>
            <respStmt>
              <resp>contributor</resp>
              <name key="155460">
                <persName>
                  <forename>Michael</forename>
                  <surname>Döhler</surname>
                </persName>
                <email type="md5">8bead8b4c1e2b9454e86a2b4d10f8471</email>
                <email type="domain">inria.fr</email>
              </name>
            </respStmt>
          </editionStmt>
          <publicationStmt>
            <distributor>CCSD</distributor>
            <idno type="halId">hal-02903003</idno>
            <idno type="halUri">https://inria.hal.science/hal-02903003</idno>
            <idno type="halBibtex">mendler:hal-02903003</idno>
            <idno type="halRefHtml">&lt;i&gt;IFAC 2020 - 21st International Federation of Automatic Control World Congress&lt;/i&gt;, Jul 2020, Berlin, Germany. &lt;a target="_blank" href="https://dx.doi.org/10.1016/j.ifacol.2020.12.877"&gt;&amp;#x27E8;10.1016/j.ifacol.2020.12.877&amp;#x27E9;&lt;/a&gt;</idno>
            <idno type="halRef">IFAC 2020 - 21st International Federation of Automatic Control World Congress, Jul 2020, Berlin, Germany. &amp;#x27E8;10.1016/j.ifacol.2020.12.877&amp;#x27E9;</idno>
            <availability status="restricted">
              <licence target="https://about.hal.science/hal-authorisation-v1/">HAL Authorization<ref corresp="#file-2903003-2553961"/></licence>
            </availability>
          </publicationStmt>
          <seriesStmt>
            <idno type="stamp" n="INRIA">INRIA - Institut National de Recherche en Informatique et en Automatique</idno>
            <idno type="stamp" n="INRIA-RENNES">INRIA Rennes - Bretagne Atlantique</idno>
            <idno type="stamp" n="INRIA_TEST">INRIA - Institut National de Recherche en Informatique et en Automatique</idno>
            <idno type="stamp" n="TESTALAIN1">TESTALAIN1</idno>
            <idno type="stamp" n="IFSTTAR">Ifsttar</idno>
            <idno type="stamp" n="GENIECIVIL">Génie Civil</idno>
            <idno type="stamp" n="INRIA2">INRIA 2</idno>
            <idno type="stamp" n="INRIA-RENGRE">INRIA-RENGRE</idno>
            <idno type="stamp" n="UNIV-EIFFEL">Université Gustave Eiffel</idno>
            <idno type="stamp" n="U-EIFFEL">Université Gustave Eiffel</idno>
            <idno type="stamp" n="COSYS">Composants et systèmes</idno>
            <idno type="stamp" n="INRIA-CANADA">INRIA-CANADA</idno>
          </seriesStmt>
          <notesStmt>
            <note type="audience" n="2">International</note>
            <note type="invited" n="0">No</note>
            <note type="popular" n="0">No</note>
            <note type="peer" n="1">Yes</note>
            <note type="proceedings" n="1">Yes</note>
          </notesStmt>
          <sourceDesc>
            <biblStruct>
              <analytic>
                <title xml:lang="en">Clustering of Redundant Parameters for Fault Isolation with Gaussian Residuals</title>
                <author role="aut">
                  <persName>
                    <forename type="first">Alexander</forename>
                    <surname>Mendler</surname>
                  </persName>
                  <idno type="halauthorid">2037842-0</idno>
                  <affiliation ref="#struct-366034"/>
                  <affiliation ref="#struct-581040"/>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">Michael</forename>
                    <surname>Döhler</surname>
                  </persName>
                  <email type="md5">8bead8b4c1e2b9454e86a2b4d10f8471</email>
                  <email type="domain">inria.fr</email>
                  <idno type="idhal" notation="string">michael-doehler</idno>
                  <idno type="idhal" notation="numeric">2175</idno>
                  <idno type="halauthorid" notation="string">22492-2175</idno>
                  <idno type="ORCID">https://orcid.org/0000-0003-4844-5474</idno>
                  <idno type="IDREF">https://www.idref.fr/159299306</idno>
                  <affiliation ref="#struct-581040"/>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">Carlos</forename>
                    <surname>Ventura</surname>
                  </persName>
                  <idno type="halauthorid">840124-0</idno>
                  <affiliation ref="#struct-366034"/>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">Laurent</forename>
                    <surname>Mevel</surname>
                  </persName>
                  <email type="md5">b5e4a468869b48aa12d342f34f0c3177</email>
                  <email type="domain">inria.fr</email>
                  <idno type="idhal" notation="string">laurent-mevel</idno>
                  <idno type="idhal" notation="numeric">14387</idno>
                  <idno type="halauthorid" notation="string">15077-14387</idno>
                  <idno type="IDREF">https://www.idref.fr/093658907</idno>
                  <affiliation ref="#struct-581040"/>
                </author>
              </analytic>
              <monogr>
                <meeting>
                  <title>IFAC 2020 - 21st International Federation of Automatic Control World Congress</title>
                  <date type="start">2020-07-11</date>
                  <date type="end">2020-07-17</date>
                  <settlement>Berlin</settlement>
                  <country key="DE">Germany</country>
                </meeting>
                <imprint>
                  <date type="datePub">2020-01-01</date>
                </imprint>
              </monogr>
              <idno type="doi">10.1016/j.ifacol.2020.12.877</idno>
              <ref type="publisher">https://www.ifac2020.org/</ref>
            </biblStruct>
          </sourceDesc>
          <profileDesc>
            <langUsage>
              <language ident="en">English</language>
            </langUsage>
            <textClass>
              <keywords scheme="author">
                <term xml:lang="en">Stochastic dynamic system</term>
                <term xml:lang="en">Sensitivity matrix</term>
                <term xml:lang="en">Over-parametrization</term>
                <term xml:lang="en">Fault isolation</term>
                <term xml:lang="fr">Modèle stochastique</term>
                <term xml:lang="fr">Processus stochastique</term>
                <term xml:lang="fr">Isolation</term>
                <term xml:lang="fr">Système dynamique</term>
                <term xml:lang="fr">Test paramétrique</term>
              </keywords>
              <classCode scheme="halDomain" n="spi.gciv.dv">Engineering Sciences [physics]/Civil Engineering/Dynamique, vibrations</classCode>
              <classCode scheme="halDomain" n="stat.ap">Statistics [stat]/Applications [stat.AP]</classCode>
              <classCode scheme="halTypology" n="COMM">Conference papers</classCode>
              <classCode scheme="halOldTypology" n="COMM">Conference papers</classCode>
              <classCode scheme="halTreeTypology" n="COMM">Conference papers</classCode>
            </textClass>
            <abstract xml:lang="fr">
              <p>Fault detection and isolation in stochastic systems is typically model-based, meaning fault-indicating residuals are generated based on measurements and compared to equivalent mathematical system models. The residuals often exhibit Gaussian properties or can be transformed into a standard Gaussian framework by means of the asymptotic local approach. The e_ectiveness of the fault diagnosis depends on the model quality, but an increasing number of model parameters also leads to redundancies which, in turn, can distort the fault isolation. This occurs, for example, in structural engineering, where residuals are generated by comparing structural vibrations to the output of digital twins. This article proposes a framework to _nd the optimal parameter clusters for such problems. It explains how the optimal solution is a compromise, because with an increasing number of clusters, the fault isolation resolution increases, but the detectability in each cluster decreases, and the number of false alarms changes. To assess these factors during the clustering process, criteria for the minimum detectable change and the false-alarm susceptibility are introduced and evaluated in an optimization scheme.</p>
            </abstract>
          </profileDesc>
        </biblFull>
      </listBibl>
    </body>
    <back>
      <listOrg type="structures">
        <org type="institution" xml:id="struct-366034" status="VALID">
          <idno type="IdRef">028326792</idno>
          <idno type="ISNI">0000000122889830</idno>
          <idno type="ROR">https://ror.org/03rmrcq20</idno>
          <idno type="Wikidata">Q391028</idno>
          <orgName>University of British Columbia [Canada]</orgName>
          <orgName type="acronym">UBC</orgName>
          <date type="start">1908-01-01</date>
          <desc>
            <address>
              <addrLine>Vancouver Campus, 2329 West Mall, Vancouver, BC, V6T 1Z4 / Okanagan Campus, 3333 University Way, Kelowna, BC, V1V 1V7</addrLine>
              <country key="CA"/>
            </address>
            <ref type="url">https://www.ubc.ca</ref>
          </desc>
        </org>
        <org type="researchteam" xml:id="struct-581040" status="VALID">
          <idno type="RNSR">200920933U</idno>
          <idno type="ROR">https://ror.org/00c9pnr51</idno>
          <orgName>Statistical Inference for Structural Health Monitoring</orgName>
          <orgName type="acronym">I4S</orgName>
          <date type="start">2017-01-01</date>
          <date type="end">2028-10-31</date>
          <desc>
            <address>
              <addrLine>Campus de Beaulieu 35042 Rennes cedex</addrLine>
              <country key="FR"/>
            </address>
          </desc>
          <listRelation>
            <relation active="#struct-419153" type="direct"/>
            <relation active="#struct-300009" type="indirect"/>
            <relation active="#struct-581119" type="direct"/>
            <relation active="#struct-580722" type="indirect"/>
          </listRelation>
        </org>
        <org type="laboratory" xml:id="struct-419153" status="VALID">
          <idno type="RNSR">198018249C</idno>
          <idno type="ROR">https://ror.org/04040yw90</idno>
          <orgName>Centre Inria de l'Université de Rennes</orgName>
          <desc>
            <address>
              <addrLine>Campus de beaulieu35042 Rennes cedex</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">http://www.inria.fr/centre/rennes</ref>
          </desc>
          <listRelation>
            <relation active="#struct-300009" type="direct"/>
          </listRelation>
        </org>
        <org type="institution" xml:id="struct-300009" status="VALID">
          <idno type="ROR">https://ror.org/02kvxyf05</idno>
          <orgName>Institut National de Recherche en Informatique et en Automatique</orgName>
          <orgName type="acronym">Inria</orgName>
          <desc>
            <address>
              <addrLine>Domaine de VoluceauRocquencourt - BP 10578153 Le Chesnay Cedex</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">http://www.inria.fr/en/</ref>
          </desc>
        </org>
        <org type="laboratory" xml:id="struct-581119" status="VALID">
          <orgName>Structure et Instrumentation Intégrée</orgName>
          <orgName type="acronym">COSYS-SII</orgName>
          <date type="start">2020-01-01</date>
          <desc>
            <address>
              <addrLine>Allée des Ponts et ChausséesRoute de Bouaye 44344 Bouguenais Cedex</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">https://www.sii.ifsttar.fr/linstitut/cosys/laboratoires/sii-ifsttar/</ref>
          </desc>
          <listRelation>
            <relation active="#struct-580722" type="direct"/>
          </listRelation>
        </org>
        <org type="institution" xml:id="struct-580722" status="VALID">
          <idno type="ROR">https://ror.org/03x42jk29</idno>
          <orgName>Université Gustave Eiffel</orgName>
          <date type="start">2020-01-01</date>
          <desc>
            <address>
              <addrLine>Cité Descartes, 5 Boulevard Descartes • Champs-sur-Marne, 77454 Marne-la-Vallée Cedex 2</addrLine>
              <country key="FR"/>
            </address>
            <ref type="url">https://www.univ-gustave-eiffel.fr/</ref>
          </desc>
        </org>
      </listOrg>
    </back>
  </text>
</TEI>