Thickness determination in anisotropic media with plasmon waveguide resonance imaging - Inria - Institut national de recherche en sciences et technologies du numérique Access content directly
Journal Articles Optics Express Year : 2019

Thickness determination in anisotropic media with plasmon waveguide resonance imaging

Abstract

This paper describes a simple procedure to determine the local thickness of a thin anisotropic layer. It also discriminates between isotropic and anisotropic regions, provided a smoothness hypothesis on the refractive index distribution is satisfied. The procedure is based on the analysis of surface plasmon resonance (SPR) data acquired in an imaging mode. The general arrangement of the setup is the Kretschmann configuration. We show, on an azobenzene modified polymer layer, good agreement between atomic force microscopy and optical measurements of thickness variation.
Fichier principal
Vignette du fichier
oe-27-3-3264.pdf (4.06 Mo) Télécharger le fichier
Origin : Publisher files allowed on an open archive
Loading...

Dates and versions

hal-02010368 , version 1 (07-02-2019)

Identifiers

Cite

Etienne Harté, Isabel Alves, Ivo Ihrke, Juan Elezgaray. Thickness determination in anisotropic media with plasmon waveguide resonance imaging. Optics Express, 2019, 27 (3), pp.3264-3275. ⟨10.1364/OE.27.003264⟩. ⟨hal-02010368⟩
107 View
91 Download

Altmetric

Share

Gmail Facebook Twitter LinkedIn More