<?xml version="1.0" encoding="utf-8"?>
<TEI xmlns="http://www.tei-c.org/ns/1.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:hal="http://hal.archives-ouvertes.fr/" xmlns:gml="http://www.opengis.net/gml/3.3/" xmlns:gmlce="http://www.opengis.net/gml/3.3/ce" version="1.1" xsi:schemaLocation="http://www.tei-c.org/ns/1.0 http://api.archives-ouvertes.fr/documents/aofr-sword.xsd">
  <teiHeader>
    <fileDesc>
      <titleStmt>
        <title>HAL TEI export of hal-01516001</title>
      </titleStmt>
      <publicationStmt>
        <distributor>CCSD</distributor>
        <availability status="restricted">
          <licence target="https://creativecommons.org/publicdomain/zero/1.0/">CC0 1.0 - Universal</licence>
        </availability>
        <date when="2026-05-20T23:08:33+02:00"/>
      </publicationStmt>
      <sourceDesc>
        <p part="N">HAL API Platform</p>
      </sourceDesc>
    </fileDesc>
  </teiHeader>
  <text>
    <body>
      <listBibl>
        <biblFull>
          <titleStmt>
            <title xml:lang="en">Tri-mode Operation for Noise Reduction and Data Preservation in Low-Leakage Multi-Threshold CMOS Circuits</title>
            <author role="aut">
              <persName>
                <forename type="first">Hailong</forename>
                <surname>Jiao</surname>
              </persName>
              <email type="md5">5de294d3d1d7c443c42fcf7aef7875e5</email>
              <email type="domain">ust.hk</email>
              <idno type="idhal" notation="numeric">1007221</idno>
              <idno type="halauthorid" notation="string">1165557-1007221</idno>
              <affiliation ref="#struct-254260"/>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">Volkan</forename>
                <surname>Kursun</surname>
              </persName>
              <email type="md5">669929080563d199094cf2b2d5ae5ed8</email>
              <email type="domain">ust.hk</email>
              <idno type="idhal" notation="numeric">1007222</idno>
              <idno type="halauthorid" notation="string">1165558-1007222</idno>
              <affiliation ref="#struct-254260"/>
            </author>
            <editor role="depositor">
              <persName>
                <forename>Hal</forename>
                <surname>Ifip</surname>
              </persName>
              <email type="md5">2073ac78024b6e13f2714db96e9b1e63</email>
              <email type="domain">inria.fr</email>
            </editor>
          </titleStmt>
          <editionStmt>
            <edition n="v1" type="current">
              <date type="whenSubmitted">2017-04-28 14:29:52</date>
              <date type="whenModified">2025-03-14 10:22:02</date>
              <date type="whenReleased">2017-04-28 15:09:00</date>
              <date type="whenProduced">2010-09-27</date>
              <date type="whenEndEmbargoed">2015-01-01</date>
              <ref type="file" target="https://inria.hal.science/hal-01516001v1/document">
                <date notBefore="2015-01-01"/>
              </ref>
              <ref type="file" subtype="author" n="1" target="https://inria.hal.science/hal-01516001v1/file/978-3-642-28566-0_11_Chapter.pdf" id="file-1516001-1576616">
                <date notBefore="2015-01-01"/>
              </ref>
              <ref type="externalLink" target="https://link.springer.com/content/pdf/10.1007%2F978-3-642-28566-0_11.pdf"/>
            </edition>
            <respStmt>
              <resp>contributor</resp>
              <name key="200187">
                <persName>
                  <forename>Hal</forename>
                  <surname>Ifip</surname>
                </persName>
                <email type="md5">2073ac78024b6e13f2714db96e9b1e63</email>
                <email type="domain">inria.fr</email>
              </name>
            </respStmt>
          </editionStmt>
          <publicationStmt>
            <distributor>CCSD</distributor>
            <idno type="halId">hal-01516001</idno>
            <idno type="halUri">https://inria.hal.science/hal-01516001</idno>
            <idno type="halBibtex">jiao:hal-01516001</idno>
            <idno type="halRefHtml">&lt;i&gt;18th International Conference on Very Large Scale Integration (VLSISOC)&lt;/i&gt;, Sep 2010, Madrid, Spain. pp.258-290, &lt;a target="_blank" href="https://dx.doi.org/10.1007/978-3-642-28566-0_11"&gt;&amp;#x27E8;10.1007/978-3-642-28566-0_11&amp;#x27E9;&lt;/a&gt;</idno>
            <idno type="halRef">18th International Conference on Very Large Scale Integration (VLSISOC), Sep 2010, Madrid, Spain. pp.258-290, &amp;#x27E8;10.1007/978-3-642-28566-0_11&amp;#x27E9;</idno>
            <availability status="restricted">
              <licence target="https://creativecommons.org/licenses/by/4.0/">CC BY 4.0 - Attribution<ref corresp="#file-1516001-1576616"/></licence>
            </availability>
          </publicationStmt>
          <seriesStmt>
            <idno type="stamp" n="IFIP">IFIP - International Federation for Information Processing</idno>
            <idno type="stamp" n="IFIP-AICT" corresp="IFIP">IFIP Advances in Information and Communication Technology</idno>
            <idno type="stamp" n="IFIP-TC" corresp="IFIP">IFIP Technical Committees </idno>
            <idno type="stamp" n="IFIP-WG" corresp="IFIP">Working Groups</idno>
            <idno type="stamp" n="IFIP-VLSISOC" corresp="IFIP">IFIP-VLSISOC</idno>
            <idno type="stamp" n="IFIP-TC10" corresp="IFIP-TC">IFIP-TC10</idno>
            <idno type="stamp" n="IFIP-WG10-5" corresp="IFIP-WG">WG10-5: Design and Engineering of Electronic Systems</idno>
            <idno type="stamp" n="IFIP-AICT-373" corresp="IFIP-AICT">VLSI-SoC: Forward-Looking Trends in IC and Systems Design</idno>
          </seriesStmt>
          <notesStmt>
            <note type="audience" n="2">International</note>
            <note type="invited" n="0">No</note>
            <note type="popular" n="0">No</note>
            <note type="peer" n="1">Yes</note>
            <note type="proceedings" n="1">Yes</note>
          </notesStmt>
          <sourceDesc>
            <biblStruct>
              <analytic>
                <title xml:lang="en">Tri-mode Operation for Noise Reduction and Data Preservation in Low-Leakage Multi-Threshold CMOS Circuits</title>
                <author role="aut">
                  <persName>
                    <forename type="first">Hailong</forename>
                    <surname>Jiao</surname>
                  </persName>
                  <email type="md5">5de294d3d1d7c443c42fcf7aef7875e5</email>
                  <email type="domain">ust.hk</email>
                  <idno type="idhal" notation="numeric">1007221</idno>
                  <idno type="halauthorid" notation="string">1165557-1007221</idno>
                  <affiliation ref="#struct-254260"/>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">Volkan</forename>
                    <surname>Kursun</surname>
                  </persName>
                  <email type="md5">669929080563d199094cf2b2d5ae5ed8</email>
                  <email type="domain">ust.hk</email>
                  <idno type="idhal" notation="numeric">1007222</idno>
                  <idno type="halauthorid" notation="string">1165558-1007222</idno>
                  <affiliation ref="#struct-254260"/>
                </author>
              </analytic>
              <monogr>
                <title level="m">IFIP Advances in Information and Communication Technology</title>
                <meeting>
                  <title>18th International Conference on Very Large Scale Integration (VLSISOC)</title>
                  <date type="start">2010-09-27</date>
                  <date type="end">2010-09-29</date>
                  <settlement>Madrid</settlement>
                  <country key="ES">Spain</country>
                </meeting>
                <editor>José L. Ayala</editor>
                <editor>David Atienza Alonso</editor>
                <editor>Ricardo Reis</editor>
                <imprint>
                  <publisher>Springer</publisher>
                  <biblScope unit="serie">VLSI-SoC: Forward-Looking Trends in IC and Systems Design</biblScope>
                  <biblScope unit="volume">AICT-373</biblScope>
                  <biblScope unit="pp">258-290</biblScope>
                  <date type="datePub">2012</date>
                </imprint>
              </monogr>
              <idno type="doi">10.1007/978-3-642-28566-0_11</idno>
            </biblStruct>
          </sourceDesc>
          <profileDesc>
            <langUsage>
              <language ident="en">English</language>
            </langUsage>
            <textClass>
              <keywords scheme="author">
                <term xml:lang="en">electrical quality</term>
                <term xml:lang="en">activation delay</term>
                <term xml:lang="en">activation noise</term>
                <term xml:lang="en">leakage power consumption</term>
                <term xml:lang="en">subthreshold leakage currents</term>
                <term xml:lang="en">sleep transistor miniaturization</term>
                <term xml:lang="en">forward body bias</term>
                <term xml:lang="en">data preserving SLEEP mode</term>
                <term xml:lang="en">tri-mode MTCMOS</term>
                <term xml:lang="en">Mode transition noise</term>
              </keywords>
              <classCode scheme="halDomain" n="info">Computer Science [cs]</classCode>
              <classCode scheme="halTypology" n="COMM">Conference papers</classCode>
              <classCode scheme="halOldTypology" n="COMM">Conference papers</classCode>
              <classCode scheme="halTreeTypology" n="COMM">Conference papers</classCode>
            </textClass>
            <abstract xml:lang="en">
              <p>Multi-threshold CMOS (MTCMOS) is the most widely used circuit technique for suppressing subthreshold leakage currents in idle circuits. When a conventional MTCMOS circuit transitions from SLEEP mode to ACTIVE mode, voltages of power and ground distribution networks are disturbed. Mode transition noise phenomenon in MTCMOS circuits is examined in this chapter. An MTCMOS circuit technique with three operating modes (tri-mode) is described for noise suppression during activation events. A threshold voltage tuning methodology is presented to further alleviate the mode transition noise with smaller sleep transistors in MTCMOS circuits. Alternative applications of tri-mode MTCMOS for data preservation and leakage power reduction in idle memory elements are also discussed.</p>
            </abstract>
            <particDesc>
              <org type="consortium">TC 10</org>
              <org type="consortium">TC 10.5</org>
            </particDesc>
          </profileDesc>
        </biblFull>
      </listBibl>
    </body>
    <back>
      <listOrg type="structures">
        <org type="laboratory" xml:id="struct-254260" status="INCOMING">
          <orgName>Department of electronic and computer engineering</orgName>
          <orgName type="acronym">HKUST</orgName>
          <desc>
            <address>
              <country key="CN"/>
            </address>
          </desc>
          <listRelation>
            <relation active="#struct-97019" type="direct"/>
          </listRelation>
        </org>
        <org type="institution" xml:id="struct-97019" status="VALID">
          <idno type="IdRef">129076511</idno>
          <idno type="ISNI">0000000419371450</idno>
          <idno type="ROR">https://ror.org/00q4vv597</idno>
          <idno type="Wikidata">Q1333303</idno>
          <orgName>Hong Kong University of Science and Technology</orgName>
          <orgName type="acronym">HKUST</orgName>
          <date type="start">1911-01-01</date>
          <desc>
            <address>
              <addrLine>Clear Water Bay Kowloon Hong Kong</addrLine>
              <country key="HK"/>
            </address>
            <ref type="url">http://www.ust.hk/eng/index.htm</ref>
          </desc>
        </org>
      </listOrg>
    </back>
  </text>
</TEI>