<?xml version="1.0" encoding="utf-8"?>
<TEI xmlns="http://www.tei-c.org/ns/1.0" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" xmlns:hal="http://hal.archives-ouvertes.fr/" xmlns:gml="http://www.opengis.net/gml/3.3/" xmlns:gmlce="http://www.opengis.net/gml/3.3/ce" version="1.1" xsi:schemaLocation="http://www.tei-c.org/ns/1.0 http://api.archives-ouvertes.fr/documents/aofr-sword.xsd">
  <teiHeader>
    <fileDesc>
      <titleStmt>
        <title>HAL TEI export of hal-01055241</title>
      </titleStmt>
      <publicationStmt>
        <distributor>CCSD</distributor>
        <availability status="restricted">
          <licence target="https://creativecommons.org/publicdomain/zero/1.0/">CC0 1.0 - Universal</licence>
        </availability>
        <date when="2026-05-21T10:21:07+02:00"/>
      </publicationStmt>
      <sourceDesc>
        <p part="N">HAL API Platform</p>
      </sourceDesc>
    </fileDesc>
  </teiHeader>
  <text>
    <body>
      <listBibl>
        <biblFull>
          <titleStmt>
            <title xml:lang="en">Black-Box System Testing of Real-Time Embedded                                    Systems Using Random and Search-based Testing</title>
            <author role="aut">
              <persName>
                <forename type="first">Andrea</forename>
                <surname>Arcuri</surname>
              </persName>
              <idno type="halauthorid">853151-0</idno>
              <affiliation ref="#struct-23364"/>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">Muhammad Zohaib</forename>
                <surname>Iqbal</surname>
              </persName>
              <idno type="halauthorid">853152-0</idno>
              <affiliation ref="#struct-23364"/>
              <affiliation ref="#struct-10023"/>
            </author>
            <author role="aut">
              <persName>
                <forename type="first">Lionel</forename>
                <surname>Briand</surname>
              </persName>
              <idno type="halauthorid">853153-0</idno>
              <affiliation ref="#struct-23364"/>
              <affiliation ref="#struct-10023"/>
            </author>
            <editor role="depositor">
              <persName>
                <forename>Hal</forename>
                <surname>Ifip</surname>
              </persName>
              <email type="md5">2073ac78024b6e13f2714db96e9b1e63</email>
              <email type="domain">inria.fr</email>
            </editor>
          </titleStmt>
          <editionStmt>
            <edition n="v1" type="current">
              <date type="whenSubmitted">2014-08-12 09:25:49</date>
              <date type="whenModified">2023-10-19 14:22:31</date>
              <date type="whenReleased">2014-08-12 09:59:16</date>
              <date type="whenProduced">2010-11-08</date>
              <date type="whenEndEmbargoed">2014-08-12</date>
              <ref type="file" target="https://inria.hal.science/hal-01055241v1/document">
                <date notBefore="2014-08-12"/>
              </ref>
              <ref type="file" subtype="author" n="1" target="https://inria.hal.science/hal-01055241v1/file/64350094.pdf" id="file-1055241-859723">
                <date notBefore="2014-08-12"/>
              </ref>
              <ref type="externalLink" target="https://link.springer.com/content/pdf/10.1007%2F978-3-642-16573-3_8.pdf"/>
            </edition>
            <respStmt>
              <resp>contributor</resp>
              <name key="200187">
                <persName>
                  <forename>Hal</forename>
                  <surname>Ifip</surname>
                </persName>
                <email type="md5">2073ac78024b6e13f2714db96e9b1e63</email>
                <email type="domain">inria.fr</email>
              </name>
            </respStmt>
          </editionStmt>
          <publicationStmt>
            <distributor>CCSD</distributor>
            <idno type="halId">hal-01055241</idno>
            <idno type="halUri">https://inria.hal.science/hal-01055241</idno>
            <idno type="halBibtex">arcuri:hal-01055241</idno>
            <idno type="halRefHtml">&lt;i&gt;22nd IFIP WG 6.1 International Conference on Testing Software and Systems (ICTSS)&lt;/i&gt;, Nov 2010, Natal, Brazil. pp.95-110, &lt;a target="_blank" href="https://dx.doi.org/10.1007/978-3-642-16573-3_8"&gt;&amp;#x27E8;10.1007/978-3-642-16573-3_8&amp;#x27E9;&lt;/a&gt;</idno>
            <idno type="halRef">22nd IFIP WG 6.1 International Conference on Testing Software and Systems (ICTSS), Nov 2010, Natal, Brazil. pp.95-110, &amp;#x27E8;10.1007/978-3-642-16573-3_8&amp;#x27E9;</idno>
            <availability status="restricted">
              <licence target="https://creativecommons.org/licenses/by/4.0/">CC BY 4.0 - Attribution<ref corresp="#file-1055241-859723"/></licence>
            </availability>
          </publicationStmt>
          <seriesStmt>
            <idno type="stamp" n="IFIP-LNCS" corresp="IFIP">IFIP - Lecture Notes in Computer Science</idno>
            <idno type="stamp" n="IFIP">IFIP - International Federation for Information Processing</idno>
            <idno type="stamp" n="IFIP-LNCS-6435" corresp="IFIP-LNCS">Testing Software and Systems</idno>
            <idno type="stamp" n="IFIP-TC" corresp="IFIP">IFIP Technical Committees </idno>
            <idno type="stamp" n="IFIP-WG" corresp="IFIP">Working Groups</idno>
            <idno type="stamp" n="IFIP-TC6" corresp="IFIP-TC">TC 6: Communication Systems</idno>
            <idno type="stamp" n="IFIP-WG6-1" corresp="IFIP-WG">Architectures and Protocols for Distributed Systems</idno>
            <idno type="stamp" n="IFIP-ICTSS">IFIP-ICTSS</idno>
            <idno type="stamp" n="IFIP-2010">IFIP-2010</idno>
          </seriesStmt>
          <notesStmt>
            <note type="audience" n="2">International</note>
            <note type="invited" n="0">No</note>
            <note type="popular" n="0">No</note>
            <note type="peer" n="1">Yes</note>
            <note type="proceedings" n="1">Yes</note>
          </notesStmt>
          <sourceDesc>
            <biblStruct>
              <analytic>
                <title xml:lang="en">Black-Box System Testing of Real-Time Embedded                                    Systems Using Random and Search-based Testing</title>
                <author role="aut">
                  <persName>
                    <forename type="first">Andrea</forename>
                    <surname>Arcuri</surname>
                  </persName>
                  <idno type="halauthorid">853151-0</idno>
                  <affiliation ref="#struct-23364"/>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">Muhammad Zohaib</forename>
                    <surname>Iqbal</surname>
                  </persName>
                  <idno type="halauthorid">853152-0</idno>
                  <affiliation ref="#struct-23364"/>
                  <affiliation ref="#struct-10023"/>
                </author>
                <author role="aut">
                  <persName>
                    <forename type="first">Lionel</forename>
                    <surname>Briand</surname>
                  </persName>
                  <idno type="halauthorid">853153-0</idno>
                  <affiliation ref="#struct-23364"/>
                  <affiliation ref="#struct-10023"/>
                </author>
              </analytic>
              <monogr>
                <title level="m">Lecture Notes in Computer                                        Science</title>
                <meeting>
                  <title>22nd IFIP WG 6.1 International Conference on Testing Software and Systems (ICTSS)</title>
                  <date type="start">2010-11-08</date>
                  <date type="end">2010-11-10</date>
                  <settlement>Natal</settlement>
                  <country key="BR">Brazil</country>
                </meeting>
                <editor>Alexandre Petrenko; Adenilso Simão; José Carlos                                    Maldonado</editor>
                <imprint>
                  <publisher>Springer</publisher>
                  <biblScope unit="serie">Testing Software and Systems</biblScope>
                  <biblScope unit="volume">LNCS-6435</biblScope>
                  <biblScope unit="pp">95-110</biblScope>
                  <date type="datePub">2010</date>
                </imprint>
              </monogr>
              <idno type="doi">10.1007/978-3-642-16573-3_8</idno>
            </biblStruct>
          </sourceDesc>
          <profileDesc>
            <langUsage>
              <language ident="en">English</language>
            </langUsage>
            <textClass>
              <keywords scheme="author">
                <term xml:lang="en">OCL</term>
                <term xml:lang="en">MARTE</term>
                <term xml:lang="en">UML</term>
                <term xml:lang="en">context</term>
                <term xml:lang="en">environment</term>
                <term xml:lang="en">model based testing</term>
                <term xml:lang="en">branch distance</term>
                <term xml:lang="en">Search based software engineering</term>
              </keywords>
              <classCode scheme="halDomain" n="info.info-dl">Computer Science [cs]/Digital Libraries [cs.DL]</classCode>
              <classCode scheme="halTypology" n="COMM">Conference papers</classCode>
              <classCode scheme="halOldTypology" n="COMM">Conference papers</classCode>
              <classCode scheme="halTreeTypology" n="COMM">Conference papers</classCode>
            </textClass>
            <abstract xml:lang="en">
              <p>Testing real-time embedded systems (RTES) is in many                            ways challenging. Thousands of test cases can be potentially executed on                            an industrial RTES. Given the magnitude of testing at the system level,                            only a fully automated approach can really scale up to test industrial                            RTES. In this paper we take a black-box approach and model the RTES                            environment using the UML/MARTE international standard. Our main                            motivation is to provide a more practical approach to the model-based                            testing of RTES by allowing system testers, who are often not familiar                            with the system design but know the application domain well-enough, to                            model the environment to enable test automation. Environment models can                            support the automation of three tasks: the code generation of an                            environment simulator, the selection of test cases, and the evaluation                            of their expected results (oracles). In this paper, we focus on the                            second task (test case selection) and investigate three test automation                            strategies using inputs from UML/MARTE environment models: Random                            Testing (baseline), Adaptive Random Testing, and Search-Based Testing                            (using Genetic Algorithms). Based on one industrial case study and three                            artificial systems, we show how, in general, no technique is better than                            the others. Which test selection technique to use is determined by the                            failure rate (testing stage) and the execution time of test cases.                            Finally, we propose a practical process to combine the use of all three                            test strategies.</p>
            </abstract>
          </profileDesc>
        </biblFull>
      </listBibl>
    </body>
    <back>
      <listOrg type="structures">
        <org type="institution" xml:id="struct-23364" status="VALID">
          <idno type="ROR">https://ror.org/00vn06n10</idno>
          <orgName>Simula Research Laboratory [Lysaker]</orgName>
          <orgName type="acronym">SRL</orgName>
          <desc>
            <address>
              <addrLine>Leon MoonenSimula Research LaboratoryP.O. Box 1341325 LysakerNorway</addrLine>
              <country key="NO"/>
            </address>
            <ref type="url">http://www.simula.no/</ref>
          </desc>
        </org>
        <org type="laboratory" xml:id="struct-10023" status="VALID">
          <orgName>Department of Informatics [Oslo]</orgName>
          <desc>
            <address>
              <addrLine>Informatikkbygget Gaustadalléen 23 N-0371 Oslo Norway</addrLine>
              <country key="NO"/>
            </address>
            <ref type="url">http://www.ifi.uio.no/english/</ref>
          </desc>
          <listRelation>
            <relation active="#struct-228190" type="direct"/>
            <relation active="#struct-50791" type="indirect"/>
          </listRelation>
        </org>
        <org type="regrouplaboratory" xml:id="struct-228190" status="VALID">
          <orgName>Faculty of Mathematics and Natural Sciences [Oslo]</orgName>
          <desc>
            <address>
              <addrLine>Fysikkbygningen Ost,  Sem Saelands vei 24,  0371 OSLO</addrLine>
              <country key="NO"/>
            </address>
            <ref type="url">http://www.mn.uio.no/english/</ref>
          </desc>
          <listRelation>
            <relation active="#struct-50791" type="direct"/>
          </listRelation>
        </org>
        <org type="institution" xml:id="struct-50791" status="VALID">
          <idno type="IdRef">028101138</idno>
          <idno type="ROR">https://ror.org/01xtthb56</idno>
          <orgName>University of Oslo</orgName>
          <orgName type="acronym">UiO</orgName>
          <desc>
            <address>
              <addrLine>P.O 1072 Blindern 0316 Oslo</addrLine>
              <country key="NO"/>
            </address>
            <ref type="url">http://www.uio.no/english/</ref>
          </desc>
        </org>
      </listOrg>
    </back>
  </text>
</TEI>