MRAM RF test Software Integrated circuits Fault Injection Robustness Fault attacks Single event upset SEU Simulation VLSI Sécurité Testing Design space exploration Accelerometer Crosstalk Security Process variability Monitoring Automatic test pattern generation Education Integrated circuit interconnections ZigBee Hardware security SEU Cross section Neutron Test cost reduction Spintronics SoC Test efficiency Random access memory Approximate Computing Logic gates Protons 1-bit acquisition AES Machine learning Estimation Sensors ATPG FPGA Delays Noise measurement Performance Noise 3D integration Digital signal processing Fault tolerance Cryptography Test Atmospheric neutrons Variability Clocks Digital ATE Phase noise Switches Microprocessors Soft errors Indirect testing Computer architecture Magnetic tunneling DPA Carbon nanotubes RF integrated circuits Test and Security Embedded systems IoT Power demand RSA Integrated circuit modeling CMOS Power supplies Fault Tolerance Silicon Fiabilité Energy efficiency SRAM Countermeasures Machine Learning Modeling STT-MRAM Approximate computing Power consumption Hardware Radiation Through-silicon vias Integrated circuit design Failure analysis Transistors Neutrons Internet of Things Circuit faults Soft error Design BIST MEMS Reliability Fault injection Integrated circuit testing Integrated circuit reliability