Hardware Testing Cross section Test RF test Random access memory BIST Test efficiency Carbon nanotubes Test and Security Circuit faults Protons Fiabilité Integrated circuit design Internet of Things Modeling AES Design space exploration FPGA Magnetic tunneling Logic gates ZigBee Approximate computing 1-bit acquisition Cryptography SEU Fault tolerance Neutrons Computer architecture Security Digital ATE Monitoring Silicon Crosstalk SoC RF integrated circuits Power demand Integrated circuits Reliability Variability Atmospheric neutrons Countermeasures ATPG Estimation RSA Fault attacks Radiation Fault injection Simulation Microprocessors Through-silicon vias DPA Spintronics VLSI Machine learning SRAM Machine Learning Integrated circuit reliability Embedded systems Sensors Software Power supplies Digital signal processing Soft error Neutron Indirect testing MRAM IoT Soft errors Performance Failure analysis Fault Tolerance Fault Injection MEMS STT-MRAM Power consumption Noise Test cost reduction Transistors Integrated circuit testing Clocks Switches Design Sécurité Robustness Education Accelerometer Integrated circuit modeling Energy efficiency Automatic test pattern generation Hardware security Approximate Computing Process variability Phase noise Single event upset SEU Noise measurement 3D integration Delays CMOS Integrated circuit interconnections