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Mots clés
Aluminum
NRP
Aluminium
Stable isotopic tracing
XRD
Zinc oxide
2H
Capillary condensation
13C
Nickel
17O
Nanostructures
Charge exchange
7550Ee
Indium oxide
Oxygen deficiency
Transparent conductive oxide TCO
XPS
Ion implantation
EPR
Defects
Energy loss
Epitaxy
Metal-insulator transition
6855Jk
GaMnAs
Isotopic Tracing
8140Ef
Atomic Layer Deposition ALD
Growth
Gold
17Opp
SiC
Passivation
Nitridation
Magnetic semiconductors
Adsorbed layers
Pulsed laser deposition
Oxidation
15N
Measurement
17Op
27Alda
Nuclear resonance profiling NRP
Low energy electron diffraction LEED
ADSORPTION DESORPTION HYSTERESIS
Silicon Carbide
Photoluminescence
Density functional theory
7630Lh
PIXE
3C-SiC
Auger electron spectroscopy AES
Topological defects
Diffusion
27Ald p&α
Thin films
Al2O3
Interface defects
Topological insulators
HfO2
AFM
Pb centers
Hysteresis
Annealing
18O
Alloys
Ion beam analysis
Ageing
RBS
Adsorption
Silicon carbide
Ferromagnetic resonance
Acoustic
X-ray diffraction
Multilayer
Nanoparticles
Channeling
Raman spectroscopy
Silicon
Kossel diffraction
Sputtering
Magnetization curves
ALD
Gallium oxide
Magnetic anisotropy
Evaluation
Periodic multilayer
Adsorption Isotherms
Thin film
Alloy
Epitaxial growth
Acoustic propreties of solid
7550Pp
18O resonance
Nuclear reaction analysis
Rutherford backscattering spectrometry RBS
Silica
27Aldp
AC susceptibility